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本篇博文主要是讲述一下计算机组成原理实验中双端口存储器原理实验,因为很多同学在刚学习计算机组成原理实验的时候对于调试的一些步骤还是有些懵懵懂懂,每个步骤之间的连接做的不是很连贯,故有了写此篇博文的初衷,笔者会在近期分享计算机组成原理实验的五个实验,希望对有学习此课程的同学能够有一些帮助!(第一篇博文所写的前缀)
实验目的
(1)了解双端口静态随机存储器IDT7132的工作特性及使用方法。
(2)了解半导体存储器怎样存储和读出数据。
实验任务
(1)将数码开关SW0—SW7(SW0是最低位)设置为00H,将此数据作为地址置入AR1;然后重新设置二进制开关控制,将数码开关SW0—SW7上的数00H写入RAM第0号单元。依此在存储器10H单元写入数据01H,20H单元写入02H,30H单元写入03H,40H单元写入04H,共存入5个数据。
使用双端口存储器的左端口,依次读出存储器第00H、10H、20H、30H、40H单元中的内容,观察上述各单元中的内容是否与该单元的地址号相同。
(2)通过双端口存储器右端口(指令端口),依次把存储器第00H、10H、20H、30H、40H单元中的内容置入指令寄存器IR,观察结果是否与(1)相同。
第一步,打开仿真实验系统后选择仿真面板:
第二步,按照右边的数据通路连接对应的导线:
点击开关后进入实验面板:
第三步,根据实验要求执行相应的操作(操作会在图片中显示步骤):此处示例实验在存储器10H单元写入数据01H,通过双端口存储器右端口(指令端口),把存储器第10H单元中的内容置入指令寄存器IR,观察结果是否相同。
1)创建单元
2)写入单元数据
3)检验写入数据是否正确
4)读出存储器的数据,写入到IR的步骤
至此,该实验就结束了!
如果觉得有帮助的同学,可以点个赞哦!
谢谢大家!